Kelvin probe 3-axis scanning | ✓ |
Surface Photovoltage | ✓ |
Tip material / diameter | 2 mm gold tip |
CPD resolution | 1 - 3 meV |
Height control (auto) | 25 mm automatic |
Kelvin probe mode and PE mode | CPD and photoemission measurements |
CPD measurement time | CPD measurements in <1 minute |
PE resolution | Full photoemission measurement |
WF measurement time | PE measurements in <5 minutes |
DOS measurements | Full access to DOS information |
Optical system | Colour camera with zoom and monitor for positioning |
Oscilloscope | Digital TFT oscilloscope for real time signal |
Test sample | Gold, aluminium, and silver test samples |
Faraday enclosure base (mm) | 450 x 450 mm optical and Faraday enclosure |
Control supplied | PC control with dedicated software |
Patented technology | US:8866505 / GB:2439439 / GB:2495998 / EU:2783205 / JP:6018645 |