Ultra-high Vacuum Scanning Kelvin ProbeUHVSKP2020 system
Our Ultra-high Vacuum Scanning Kelvin Probe (UHVSKP2020) gives the user the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20 mm. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100 mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including some examples. The work function resolution of the UHVSKP2020 is 1-3 meV.
The software allows the user digital control of probe amplitude and frequency, mean-spacing and tip potential. There is also automatic measurement of the Kelvin probe signal, work function, signal and work function averaging as well as automatic control of tip to sample mean spacing. Other features include variable scan sizes and 3D charting of the work function data. The data generated can be easily exported to Excel-compatible spreadsheets for further processing.Download brochure