KP Technology Attended 2011 Spring MRS
Professor Iain Baikie and KP Technology invited all to attend the 2011 Spring MRS, which was held in the Moscone Center in San Francisco. For 3 days Professor Baikie displayed a range of Kelvin probe systems; Scanning Kelvin Probe (SKP5050), Surface Photovoltage (SPV020), Ultra-high Vacuum (UHVKP Corner Cube) and Surface Photovoltage Spectroscopy (SPS030). The exhibition was a resounding success with existing and new clients attending the booth from across the world and across many fields of research. Thank you to all who attended and contacted us.
|Written by Dr Rachel Sheridan Published on 28 April 2011|