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Support

KP Technology prides itself on customer support and maintaining client relationships. In this area existing customers can find out more information regarding technical support, system upgrades and answers to our frequently asked questions. If you cannot find the answer to your question here, please contact us and we will be happy to assist you.

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Frequently asked questions ()

Has your question been answered in this section? If not please feel free to contact us directly with any queries.





What are corrosion chambers usually used for?
What is the Surface Photovoltage option for and how is it different from your base, system & scanning packages?
What do people use your different SPVs for?
Your literature states that you also supply the scanning platform with the SKP5050. Does that mean the regular SKP system does not have the scanning platform?
You write that with your SKP5050 package you supply the optical/TFT monitor arrangement to monitor tip-to-sample displacement and tip positioning on the sample. How are these functions achieved in other, not SKP5050 packages?
You write that your system package has tip positioning of 25.4 mm. What does that mean? Is the tip that high over the sample?
If in KP020 the tip is 2 mm, does that mean that the lateral resolution is also 2 mm? Or is it the length of the tip and why is this important?
Does KP010 require that a customer has their own sample mounts?
In what situation is the Faraday cage most useful during the KP measurements?
What are the lateral resolutions of KP020 and SKP5050?
You write that the SKP5050 has three motorised axes X,Y & Z. What is the Z axis for?
Does the SKP5050 have all the software features of SKP010?
What is the main advantage of having SKP5050 over SKP010?
Do the RHC030/RHC040 systems require a connection to a nitrogen tank?
Can you use KP020 or SKP5050 in a glove box?
In ASKP200250 what is the third translating dimension (50 mm) for?
For how long do gold coated reference samples usually last?
I was under the impression that work function should be measured in eV or meV but I have read literature stating ‘work function resolution of 1-3 eV. Is it right?
We are testing your SKP instrument to measure the potential on a sample surface. The potential (work function) is a relative, not absolute, value. What is the reference?
When exposing our sample to a high RH we find a water layer would form on the surface. We want to know the maximum thickness of the water layer that your instrument can normally work. 0.2 mm, 0.5 mm or 1.0 mm?
I am interested in using Kelvin probes to determine information about the grain and grain boundary characteristics (i.e. effective work function due to traps, trap energy and density) of our thin film samples. As I am not familiar with the technology, could you provide some information regarding the application of Kelvin Probes for polycrystalline thin film characterisation.
The application I am working with requires a very specific lighting configuration with control of wavelength and interference filters. Can your system accommodate this?
If a semiconductor is measured by the Kelvin probe, is it possible to obtain some information about the valence band edge (HOMO level)?
What would a typical sample to tip distance be during a KP measurement?
What are the vacuum requirements for KP? Is it a UHV only technique?
Is the technique sensitive to sub-monolayer changes in surface composition, or is it more appropriate for studying "thicker" thin films?

KP Technology
Burn Street, Wick, Caithness, KW1 5EH, Scotland

Telephone: +44 (0)1955 602 777
Fax: +44 (0)1955 602 555
Email: sales@kelvinprobe.com

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