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Home Products Other services News About us Science Support Clients & research Contact

Our research

KP Technology actively publish in peer-reviewed journals, in addition to our client publications which feature our systems, and regularly attend world-leading conferences where we also present our findings. 

Susanna Challinger of KP Technology won a poster prize for her contribution at the 2016 MRS Fall Meeting and Exhibition in Boston, USA.

Published papers ()

Click here to download the complete list of research conducted with our equipment.




The origins of triboemission -- Correlating wear damage with electron emissionAlessandra Ciniero, Julian Le Rouzic, Iain Baikie and Tom Reddyhoff Wear (2017), 374-375, pp.113-119Undertaken using: Ultra-high Vacuum Kelvin Probe
Measurements of Natural and Synthetic Diamond Samples Using Kelvin Probe, Surface Photovoltage and Ambient Pressure Photoemission TechniquesSusanna Challinger, Iain Baikie and A. Glen Birdwell MRS Advances (2017)Undertaken using: Ambient Pressure Photoemission Spectroscopy
Effect of Annealing Treatment on the Properties of Stoichiometric Indium Zinc Tin Oxide (IZTO) Thin FilmsMaryane Putri, Ki Hwan Kim, Chang Young Koo, Jung-A Lee, Jeong-Joo Kim, Iain D. Baikie, Angela C. Grain and Hee Young Lee Journal of Nanoelectronics and Optoelectronics (2017), 12(6), pp. 611–616Undertaken using: Ambient Pressure Photoemission Spectroscopy
An Investigation of the Energy Levels within a Common Perovskite Solar Cell Device and a Comparison of DC/AC Surface Photovoltage Spectroscopy Kelvin Probe Measurements of Different MAPBI3 Perovskite Solar Cell Device StructuresSusanna E. Challinger, Iain D. Baikie, Jonathon R. Harwell, Graham A. Turnbull and Ifor D.W. Samuel MRS Advances (2017)Undertaken using: Ambient Pressure Photoemission Spectroscopy
Probing the energy levels of perovskite solar cells via Kelvin probe and UV ambient pressure photoemission spectroscopyJ. R. Harwell, T. K. Baikie, I. D. Baikie, J. L. Payne, C. Ni, J. T. S. Irvine, G. A. Turnbull and I. D. W. Samuel; Physical Chemistry Chemical Physics (2016)Undertaken using: Ambient Pressure Photoemission Spectroscopy
Effects of Hole-Transport Layer Homogeneity in Organic Solar Cells – A Multi-Length Scale StudyHuei-Ting Chien, Markus Pölzl, Georg Koller, Susanna Challinger, Callum Fairbairn, Iain Baikie, Markus Kratzer, Christian Teichert and Bettina Friedel; Surfaces and Interfaces (2016)Undertaken using: Ambient Pressure Photoemission Spectroscopy
Near ambient pressure photoemission spectroscopy of metal and semiconductor surfacesIain D. Baikie, Angela Grain, James Sutherland and Jamie Law Physica Status Solidi (c) (2015)Undertaken using: Ambient Pressure Photoemission Spectroscopy
Dual Mode Kelvin Probe: Featuring Ambient Pressure Photoemission Spectroscopy and Contact Potential DifferenceIain D. Baikie, Angela C. Grain, James Sutherland and Jamie Law,Energy Procedia 60 (2014) 48-56 Undertaken using: Ambient Pressure Photoemission Spectroscopy
Ambient pressure photoemission spectroscopy of metal surfacesIain D. Baikie, Angela C. Grain, James Sutherland and Jamie Law, Applied Surface Science 323 (2014) 45-53 Undertaken using: Ambient Pressure Photoemission Spectroscopy
Solution-Processed LiF for Work Function Tuning in Electrode BilayersTaner Aytun, Ayse Turak, Iain Baikie, Grzegorz Halek, and Cleva W. Ow-Yan, Nano Lett. 12:1 (2012) 39–44 Undertaken using: Ultra-high Vacuum Kelvin Probe
Work Function Analysis of Gas Sensitive WO3 Layers with Pt DopingG. Halek, I.D. Baikie, H. Teterycz, P. Halek, P. Suchorska, K. Wiśniewski, IMCS 2012 – The 14th International Meeting on Chemical Sensors (2012) Undertaken using: Relative Humidity Kelvin Probe
The role of sodium surface species on oxygen charge transfer in the Pt/YSZ systemNaimah Ibrahim, Danai Poulidi, Maria Elena Rivas, Iain D. Baikie and Ian S. Metcalfe, Electrochimica Acta 76 (2012) 112-119 Undertaken using: Scanning Kelvin Probe
Applying the Kelvin probe to biological tissues: Theoretical and computational analysesAndrew C. Ahn, Brian J. Gow, Ørjan G. Martinsen, Min Zhao, Alan J. Grodzinsky and Iain D. Baikie, Physical Review E 85:6 (2012) 061901 Undertaken using: Scanning Kelvin Probe
Surface investigation by using a Scanning Kelvin ProbeG. Halek, I. D. Baikie and H. Teterycz, Students and Young Scientists Workshop, IEEE International (2010) 24-27 Undertaken using: Scanning Kelvin Probe
Work function engineering in low-temperature metalsNicholas D. Orf, Iain D. Baikie, Ofer Shapira and Yoel Fink, Applied Physics Letters 94 (2009) 113504 Undertaken using: Scanning Kelvin Probe
Changes in surface roughness and work function of indium-tin-oxide due to KrF excimer laser irradiationY. Lin, I. Baikie, W. Chou, S. Lin, H. Chang, Y. Chen and W. Liu, Journal of Vacuum Science & Technology A 23:5 (2005) 1305-1308 Undertaken using: Single-Point Kelvin Probe
Variable temperature surface photovoltage imaging of oxide and nitride coated multicrystalline silicon solar cellsI. Baikie and G. Forsyth, Microscopy of semiconducting materials 180 (2003) 519-522 Undertaken using: Single-Point Kelvin Probe
Utilisation of a micro-tip scanning Kelvin probe for non-invasive surface potential mapping of mc- Si solar cellsK. Dirscherl, I. Baikie, G. Forsyth and A. S. H. Van der Heide, Solar energy materials and solar cells 79:4 (2003) 485-494 Undertaken using: Single-Point Kelvin Probe
Surface potential and surface photovoltage of oxide and nitride coated multicrystalline silicon solar cells using a scanning Kelvin probeG. Forsyth, I. Baikie and A. S. H. van der Heide, Microscopy of semiconducting materials 180 (2003) 513-518 Undertaken using: Single-Point Kelvin Probe
Study of high- and low-work-function surfaces for hyperthermal surface ionization using an absolute Kelvin probeI. Baikie, U. Peterman, B. Lagel and K. Dirscherl, Journal of Vacuum Science and Technology A 19:4 (2001) 1460-1466 Undertaken using: Single-Point Kelvin Probe
Work function study of rhenium oxidation using an ultra high vacuum scanning Kelvin probeI. Baikie, U. Petermann, A. Speakman, B. Lagel, K. Dirscherl and P. Estrup, Journal of Applied Physics 88:7 (2000) 4371-4375 Undertaken using: Single-Point Kelvin Probe
Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparisonJ. Kim, B. Lagel, E. Moons, N. Johansson, I. Baikie, W. Salaneck, R. Friend and F. Cacialli, Synthetic metals 111 (2000) 311-314 Undertaken using: Single-Point Kelvin Probe

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Burn Street, Wick, Caithness, KW1 5EH, Scotland

Telephone: +44 (0)1955 602 777
Fax: +44 (0)1955 602 555
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